Defects in Garments Article

Article:
http://www.fibre2fashion.com/industry-article/9/837/defects-in-garments2.asp


There are faults across all areas of the apparel manufacturing industry and Quality Control, in essence, is to stop these faults because faults, no matter what size, cost money. So it is important to recognise the different types of common faults in order to then be able to set up an effective Quality Control System.
The article explains the different types of defects found when sewing garments. It begins with a brief overview of why and where quality needs to be maintained, then elaborates with the different areas in which quality can be commonly affected. These are:
• Sewing defects
• Colour defects - in relation to specifications
• Sizing defects - grading, measuring, etc
• Garment defects - manufacturing

Then lists garment defects:

• Broken snaps
• Broken Buttons
• Broken stitching
• Defective snaps
• Different shades within the same garment
• Dropped stitches
• Exposed notches
• Exposed raw edges
• Fabric defects
• Holes
• Inoperative zipper
• Loose / hanging sewing threads
• Misaligned buttons and holes
• Missing buttons
• Needle cuts / chews
• Open seams
• Pulled / loose yarn
• Stain
• Unfinished buttonhole
• Zipper too short

There are details about different types of faults within these categories, with particular note to denim products and how to recognise the different faults such as re-stitching and frayed edges. Reference is given to denim products in particular due to the large amount produced worldwide and therein the consistency of the faults. There are also tips as to how to avoid these when sewing, complete with diagrams.
In conclusion, the article sums up again why Quality is important. Namely, to build up a company reputation and customer base, to produce high sales and an overall profitable business. The quality of the product determines its value and sets standards to measure things like the sales, service and pricing.


Reference:
www.fibre2fashion.com. Defects in Garments. D.Gopalakrishnan, Arpita Nayak. 2010